Double Beam UV/Vis Spectrophotometer LUS-B31 is bench top device with 190 nm to 1100 nm wavelength range, and offers spectral bandwidth of 1 nm. With T, A, C, E work mode it is designed with Hi, Med, Low (Max. 3000 nm/min) scanning speed range. The latest ARM system and long optical system ensure high accuracy and good stability of the instrument. The 10.1 inch TFT Touch colored display and it can perform powerful functions like Photometric measurement, Quantitative measurement, Kinetics, Spectrum scan, DNA/Protein test, Multi-wavelength test etc. This advance, high quality spectrophotometer supports USB data transfer and storage system.
View CatalogWavelength range | 190 to 1100 nm |
---|---|
Spectral bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double beam 1200 lines/mm |
Photometric Range | 0 to 200 %T, -0.3 to 3A, 0 to 9999 C (0 to 9999F) |
Photometric Accuracy | 0 to 200 %T, -0.3 to 3A, 0 to 9999 C (0 to 9999F) |
Photometric Repeatability | ≤0.15 % T (0 to 100 %T), 0.001A (0 to 0.5A), 0.002A (0.5 to 1A) |
Detector | Imported silicon photodiode |
Light source | Imported Deuterium and Tungsten lamp |
Stray light | ≤ 0.03 % T @ 220 nm, 360 nm |
Stability | ± 0.0003 A/h @ 500 nm |
Data Output Port | USB drive, USB host, RS232 |
Power supply | AC 220 V, 50 Hz or 110 V, 60 Hz |
Noise | 0.0005 A @ 500 nm |
Display | 10.1 inches TFT colored capacitive touch screen |
Baseline flatness | ± 0.001 A |
Printer port | Parallel port |
Work mode | T, A, C, E |
Scanning speed | Hi, Med, Low (Max. 3000 nm/min) |
Wavelength setting | Auto |
Cuvette holder | 10 mm single hole cell holder |
Dimension | 810 × 660 × 390 mm |
Gross weight | 27 kg |
Double Beam UV/Vis Spectrophotometer is used in high requirement for precision measurement in the research and production of organic chemistry, biochemistry, medical testing, food testing, environmental protection, water testing industries, etc.
Accessories no. | Name |
---|---|
1 | 10 mm glass cuvette × 4 |
2 | 10 mm quartz cuvette × 2 |
3 | 2, power cord |
4 | User manual |
5 | PC software |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double beam 1200 lines/mm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 0.5/1/2/4/5 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double beam 1200 lines/mm |
Wavelength Range | 190 ~ 1100 nm |
Setting Wavelength | Automatic |
Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
Wavelength Accuracy | ± 0.3 nm |
Wavelength Repeatability | ≤ 0.1 nm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 0.5/1/2/4 nm |
Wavelength Accuracy | ± 0.1nm (D2, 656.1 nm), ± 0.3 nm full range |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double beam grating 1200 lines/mm |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
Wavelength range | 200 - 800 nm |
Path length | 0.2 mm (For high concentration measurement); 1.0 mm (For ordinary) |
Wavelength accuracy | ± 1 nm |
Wavelength Resolution | ≤ 3 nm (FWHM at Hg 546 nm) |
Minimum Sample size | 0.5 - 2.0 µl |
Wavelength range | 200 - 850 nm |
Path length | 1 mm, 2 mm, 5 mm, 10 mm |
Wavelength accuracy | ± 1 nm |
Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
Minimum Sample size | 0.3 - 2.0 µl |
Wavelength range | 230 nm, 260 nm, 280 nm |
Path length | 1.0 mm, 0.2 mm |
Minimum Sample size | 0.3 - 2.0 µl |
Absorbance range | 0.2 - 75A (10 mm equivalent absorbance) |
Absorbance precision | 0.002 Abs |
Cuvette | No |
PC | Inbuilt |
Wavelength range | 190 - 850 nm |
Path length | 1 mm, 0.2 mm ,0.04 mm |
Wavelength accuracy | ± 1 nm |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Single beam 1200 lines/mm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Single beam 1200 lines/mm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 0.5/1/2/4/5 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Single beam 1200 lines/mm |
Wavelength Range | 190 ~ 1100 nm |
Spectral Bandwidth | 1 nm |
Wavelength Accuracy | ± 0.3 nm |
Wavelength Repeatability | 0.2 nm |
Photometric Range | 0 - 200 % T, (-0.3) to (-3.0) A, 0 - 9999 C |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
Wavelength Range | 330 to 1000 nm |
Spectral Bandwidth | 5 nm |
Wavelength Accuracy | ± 2 nm |
Wavelength Repeatability | ≤ 1.0 nm |
Photometric Range | T: 0 to199.9%, A: -0.3 to2.5 Abs, F; 0 to 9999, C: 0 to 9999 |
Wavelength Range | 335 ~ 1000 nm |
Spectral Bandwidth | 4 nm |
Wavelength Accuracy | ± 2 nm |
Wavelength Repeatability | 1 nm |
Photometric Range | T: 0 ~ 199.9 % , A: (-0.3) ~ 2.5A bs, F: 0 ~ 9999, C: 0 ~ 9999 |
Wavelength Range | 325 ~ 1000 nm |
Setting Wavelength | Automatic |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 1.0 nm |
Wavelength Repeatability | ≤ 0.2 nm |
Wavelength Range | 320 ~ 1100 nm |
Spectral Bandwidth | 4 nm |
Wavelength Accuracy | ± 0.5 nm |
Wavelength Repeatability | ≤ 0.2 nm |
Photometric Range | (-0.3) ~ 3 A |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
Working spectral range | 190 to 900 nm |
Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
Wavelength accuracy | ± 0.15 nm |
Wavelength repeatability | ≤ 0.04 nm |
Baseline stability | ≤ 0.002 Abs / 30 min |
Wavelength range | 190 - 900 nm |
Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
Wavelength accuracy | ≤ ± 0.5 nm |
Wavelength repeatability | ≤ 0.3 nm(single direction) |
Baseline drift | ± 0.004 Abs / 30 min |
Wavelength range | 180 - 900 nm |
Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
Wavelength accuracy | ≤ 0.15 nm |
Wavelength repeatability | ± 0.1 nm |
Baseline drift | ≤ ± 0.002 Abs / 30 min (Static), ≤ ± 0.005 Abs / 30 min (Dynamic) |
Wavelength range | 180 – 900 nm |
Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
Wavelength accuracy | ≤ 0.15 nm |
Wavelength repeatability | ± 0.1 nm |
Baseline drift | ≤ ± 0.002 Abs / 30 min (Static) ≤ ± 0.005 Abs / 30 mins (Dynamic) |
Wavelength Range | 400 nm to 700 nm |
Wavelength Interval | 10 nm |
Sensor | High sensitivity silicon photodiode |
Light Source | LED |
Working Temperature Range | 0 ℃ to 45 ℃ |
Wavelength Range | 360 nm to 780 nm |
Wavelength Pitch | 10 nm |
Sensor | Silicon Photodiode Array |
Grating Method | Concave Grating |
Sphere Diameter | 152 mm |
Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Sensor | Dual light path sensor array |
Light source | A, C, D50, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, DLF, TL183, TL184, NBF, U30, CWF |
Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Sensor | Dual light path sensor array |
Light source | A, C, D50, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, DLF, TL183, TL184, NBF, U30, CWF |
Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab |
Sensor | High sensitivity silicon photodiode |
Test angle | - |
Test area | - |
Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab |
Sensor | High sensitivity silicon photodiode |
Test angle | 60° |
Test area | 5 × 10 mm |
Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab |
Sensor | Blue light enhanced sensor array |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values:ΔE*ab Maximum:0.03 |
Sensor | Dual light path sensor array |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
Emission slit | 2 nm, 5 nm, 10 nm, 20 nm |
Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
Emission slit | 2 nm, 5 nm, 10 nm, 20 nm |
Excitation Source | 150 W Xenon Lamp |
Excitation Wavelength | 200 nm to 900 nm |
Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Wavelength Accuracy | ± 0.4 nm |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |