Portable Spectrophotometer LSP-A30 is adopted with 45/0 geometry (45 ring shaped illumination, 0 observe degree), where the standard white board is included in the optical system for great accuracy of every measurement. Large data storage space up to 20000 samples measurement records. The measurement of the color of the powder, granules and other materials can be done by adding the powder accessories to this spectrophotometer.
View Catalog| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
|---|---|
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Test area | - |
| Test range | - |
| Test repeatability | - |
| Reproducibility | - |
| Inter instrument agreement | 0.2 ΔE*ab (BCRA II color tiles, average test value of 12 tiles) |
| Illumination light source | LED |
| Light source | A, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, NBF, TL83, TL184, NBF, U35 |
| Wavelength range | 400 nm to 700 nm |
| Wavelength interval | 10 nm |
| Observation angle | 2°/10° |
| Measuring aperture | 11 mm |
| Color space | CIE-L*a*b, L*C*h, L*u*v, XYZ, Yxy, Reflectance, Hunter-lab, Munsell MI, CMYK |
| Color difference formula | ΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc(2:1), ΔE*cmc(1:1),ΔE*94, ΔE*00, ΔEab(Hunter), 555 shade sort |
| Other colorimetric indices | WI (whiteness) (ASTM E313-10,ASTM E313-73,CIE/ISO, AATCC, Hunter, Taube Berger, Ganz, Stensby) YI (yellowness) (ASTM D1925，ASTM E313-00,ASTM E313-73), Tint (ASTM E313,CIE,Ganz) Metamerism index Milm, Stick color fastness, Color fastness, ISO brightness, A density, T density, M density, E density. |
| Color matching system | Not included |
| UV light source | Not included |
| Work temperature range | 0 to 45℃, relative humidity 80% or below( at 35°C ),no condensation |
| Battery capacity | Rechargeable Lithium battery, 20000 continuous measurement tests, 7.4V/600 mAh |
| Interface | USB |
| Data storage | 20000 samples |
| Display | True color TFT touch screen |
| Light source longevity | 10 years, 3 million test |
| Dimension | 181 × 73 × 112 mm |
| Weight | 800 g (without battery) |
Used in textile, plastic, food, paint, printing, automobile industries, laboratories & on-site applications for quality control purpose.
| Accessories no. | Accessories name | Unit |
| 1 | AC adapter | 1 |
| 2 | Lithium battery | 1 |
| 3 | Color QC software | 1 |
| 4 | Driver software | 1 |
| 5 | USB cable | 1 |
| 6 | Calibration tile (black and white) | 1 |
| 7 | Carrying bag | 1 |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double beam 1200 lines/mm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double beam 1200 lines/mm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double beam 1200 lines/mm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | ≤ 0.1 nm |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength range | 200 - 800 nm |
| Path length | 0.2 mm (For high concentration measurement); 1.0 mm (For ordinary) |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | ≤ 3 nm (FWHM at Hg 546 nm) |
| Minimum Sample size | 0.5 - 2.0 µl |
| Wavelength range | 200 - 850 nm |
| Path length | 1 mm, 2 mm, 5 mm, 10 mm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
| Minimum Sample size | 0.3 - 2.0 µl |
| Wavelength range | 230 nm, 260 nm, 280 nm |
| Path length | 1.0 mm, 0.2 mm |
| Minimum Sample size | 0.3 - 2.0 µl |
| Absorbance range | 0.2 - 75A (10 mm equivalent absorbance) |
| Absorbance precision | 0.002 Abs |
| Cuvette | No |
| PC | Inbuilt |
| Wavelength range | 190 - 850 nm |
| Path length | 1 mm, 0.2 mm ,0.04 mm |
| Wavelength accuracy | ± 1 nm |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Single beam 1200 lines/mm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Single beam 1200 lines/mm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Single beam 1200 lines/mm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.3 nm |
| Wavelength Repeatability | 0.2 nm |
| Photometric Range | 0 - 200 % T, (-0.3) to (-3.0) A, 0 - 9999 C |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength Range | 330 to 1000 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | ≤ 1.0 nm |
| Photometric Range | T: 0 to199.9%, A: -0.3 to2.5 Abs, F; 0 to 9999, C: 0 to 9999 |
| Wavelength Range | 335 ~ 1000 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | 1 nm |
| Photometric Range | T: 0 ~ 199.9 % , A: (-0.3) ~ 2.5A bs, F: 0 ~ 9999, C: 0 ~ 9999 |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 1.0 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Wavelength Range | 320 ~ 1100 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Photometric Range | (-0.3) ~ 3 A |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Wavelength repeatability | ≤ 0.04 nm |
| Baseline stability | ≤ 0.002 Abs / 30 min |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Wavelength accuracy | ≤ ± 0.5 nm |
| Wavelength repeatability | ≤ 0.3 nm(single direction) |
| Baseline drift | ± 0.004 Abs / 30 min |
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Wavelength accuracy | ≤ 0.15 nm |
| Wavelength repeatability | ± 0.1 nm |
| Baseline drift | ≤ ± 0.002 Abs / 30 min (Static), ≤ ± 0.005 Abs / 30 min (Dynamic) |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
| Wavelength accuracy | ≤ 0.15 nm |
| Wavelength repeatability | ± 0.1 nm |
| Baseline drift | ≤ ± 0.002 Abs / 30 min (Static) ≤ ± 0.005 Abs / 30 mins (Dynamic) |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Working Temperature Range | 0 ℃ to 45 ℃ |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Sphere Diameter | 152 mm |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Light source | A, C, D50, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, DLF, TL183, TL184, NBF, U30, CWF |
| Illumination system | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Light source | A, C, D50, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, DLF, TL183, TL184, NBF, U30, CWF |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Test area | 5 × 10 mm |
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values:ΔE*ab |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values:ΔE*ab Maximum：0.03 |
| Sensor | Dual light path sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination | d/8 (Diffused lighting, 8° observation angle) SCS optical engine (light splitting and integration system) ETC (real time calibration technology ) SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values:ΔE*ab |
| Sensor | Photoelectric diode sensor |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Emission slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Emission slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Wavelength Accuracy | ± 0.4 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
Labtron Equipment Ltd. enables the customer success through innovation, cGMP manufacturing, comprehensive service offerings, ecological and corporate sustainability.
