Fluorescence Spectrophotometer LFS-A10 consist of a high quality 150 W Xenon light source and photoelectric multiplier tube detectors for providing sufficient light intensity signal to detect sensitivity which ranges between 200 nm to 900 nm. Features fluorescence detection limit of ≤ 5×10-11 g/ml and Water Raman peak of S/N ≥ 200. It consists of the following characteristics, namely, high detection sensitivity, fast scanning speed, high dynamic range, fast 3D scanning, etc. The main principles includes measurement of absorption and fluorescence. Absorbance measurements can be taken via one or more wavelengths. The fluorescence unit increases the measuring range by 1000 for detecting DNA.
| Light source | 150 W Xenon lamp |
|---|---|
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Emission slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Wavelength accuracy | ±0.4 nm |
| Wavelength repeatability | ≤ 0.2 nm |
| Signal-to-Noise Ratio | Raman peak of water (P-P): S/N ≥ 200 (10 nm Slit) |
| Detection limit | ≤5×10-11 g/ml (Quinine Sulphate Solution) |
| Linearity | γ ≥ 0.995 |
| Peak repeatability | ≤ 1.5% |
| Stability (10 min) Zero Drift | ±0.3 |
| Stability (10 min) Value Limit | ±1.5% |
| Wavelength scan speed | Multi-speed level, Maximum at 48000 nm/min |
| Photometric value | 0.00 to 10000.00 |
| Data interface | USB 2.0 |
| Maximum power consumption | 200 W |
| Power Source | AC 220 V/50 Hz; 110 V/60 Hz |
| Dimension | 380×445×310 mm |
| Net weight | 12 kg |
| Gross weight | 14 kg |
| Accessories No. | Accessories Name | Functions |
| 1 | Membrane sample rack | For membrane samples |
| 2 | Powder sample rack | For powder samples |
| 3 | Up conversion fluorescent holder | Base holder for other racks |
| 4 | Octave Double-frequency elimination filter (300 nm,350 nm,400 nm,450 nm,500 nm,550 nm,600 nm,650 nm for one set) | Remove the interference of double-frequency peaks of these wavelengths |
| 5 | Auto polarization filter | - |
| 6 | Sample cell jacket | - |
| 7 | Peltier temperature (15 to 40°C) control holder | - |
Fluorescence Spectrophotometer finds application in material research, pharmaceutical analysis, biochemical and clinical testing, water quality analysis and control, food safety testing.
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |