Xenon Lamp Spectrophotometer LXLS-A13

Xenon Lamp Spectrophotometer LXLS-A13 consist of a high quality 150 W Xenon light source which offers a wave range of 190 nm to 1100 nm. Photoelectric multiplier tube detectors associated with it provides sufficient light intensity signal to detect sensitivity of a high resolution and this can be detected / adjusted using 10.1 inch TFT coloured capacitive touch screen. This device portrays different work mode; such as T, A, C, E which makes it more flexible to use

Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Photometric Accuracy 0.2 % T (0 to 100%T), ± 0002 A (0-0.5A), ± 0.004A(0.5-1A)
Photometric Repeatability ≤ 0.15 % T ( 0-100 % T), 0.001A (0-0.5A), 0.002A(0.5-1A)
Photometric Range 0-200% T, -0.3 to 3A, 0-9999 C (0-9999 F)
Stray Light ≤ 0.03 % T @ 22 nm, 360 nm
Stability ± 0.0003 A/h @500 nm
Baseline Flatness ± 0.002 A
Noise 0.0005 A @ 500 nm
Work Mode T, A, C, E
Scanning Speed High, Medium, Low ( Max 3000 nm/ min )
Wavelength Setting Auto
Display 10.1inch TFT Coloured Capacitive Touch Screen
Light Source Imported Xenon Lamp
Detector Imported Silicon Photodiode
Cuvette Holder 10 mm single hole cell holder
Output USB Drive, USB host, RS232
Power Supply AC 220 V/ 500 Hz or AC 110 V / 60 Hz
Packaging dimension 810 × 660 × 390 mm
Gross Weight 27 kg
  • Work mode consist of T, A, C, E
  • High quality flashing Xenon lamp can be directly used for testing without preheating and it’s shelf life is for 3 years
  • Possess strong functions like photometric measurement, quantitative measurement, kinetics, spectrum scan, DNA/protein test, Multi-wavelength test
  • Colossal in built memory is capable of saving up to 1024MB for test data and working curves
  • Data transfer can be done via using USB port that easily helps in passing on the data to excel for further processing, analysis and storage
  • Large sample chamber easily allows attachment of optional accessories
  • Flexible enough to allow USB and SD card storage
Sr. No. Name Quantity
1 Peltier / Sipper system 1 pc per box
2 Reflection accessories
3 21 CRF compliant software 1 pc per box
4 5 mm Glass Cuvettes 4 pcs per box
5 20 mm Glass Cuvettes 2 pcs per box
6 5 mm Quartz Cuvettes 2 pcs per box
7 20 mm Quartz Cuvettes 2 pcs per box
8 10 – 50 mm Manual 4-cell holder 1 pc per box
9 100 mm Manual 4-cell holder 1 pc per box
10 Auto 8-position cell holder 1 pc per box
11 Solid holder / Film holder 1 pc per box
12 Thermal Printer 1 pc per box

Designed to meet high requirement for précised measurement in the research and production of organic chemistry, biochemistry, medical testing, food testing, environmental protection, water testing industry, etc.

Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all

Double Beam UV/Vis Spectrophotometer

Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.

Wavelength range 190 to 1100 nm
Spectral bandwidth 1 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 2 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 0.5/1/2/4/5 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Excitation Source 150 W Xenon Lamp
Excitation Wavelength 200 nm to 900 nm
Excitation Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Emission Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Wavelength Range 900 nm to 2500 nm
Wavelength Accuracy ≤ 0.2
Wavelength Reproducibility ≤ 0.05
Bandwidth 8 nm