Portable Spectrophotometer LSP-A30

Portable Spectrophotometer LSP-A30 is adopted with 45/0 geometry (45 ring shaped illumination, 0 observe degree), where the standard white board is included in the optical system for great accuracy of every measurement. Large data storage space up to 20000 samples measurement records. The measurement of the color of the powder, granules and other materials can be done by adding the powder accessories to this spectrophotometer.

Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Test area -
Test range -
Test repeatability -
Reproducibility -
Inter instrument agreement 0.2 ΔE*ab (BCRA II color tiles, average test value of 12 tiles)
Illumination light source LED
Light source A, C, D50, D55, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, CWF, NBF, TL83, TL184, NBF, U35
Wavelength range 400 nm to 700 nm
Wavelength interval 10 nm
Observation angle 2°/10°
Measuring aperture 11 mm
Color space CIE-L*a*b, L*C*h, L*u*v, XYZ, Yxy, Reflectance, Hunter-lab, Munsell MI, CMYK
Color difference formula ΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc(2:1), ΔE*cmc(1:1),ΔE*94, ΔE*00, ΔEab(Hunter), 555 shade sort
Other colorimetric indices WI (whiteness) (ASTM E313-10,ASTM E313-73,CIE/ISO, AATCC, Hunter, Taube Berger, Ganz, Stensby) YI (yellowness) (ASTM D1925,ASTM E313-00,ASTM E313-73), Tint (ASTM E313,CIE,Ganz) Metamerism index Milm, Stick color fastness, Color fastness, ISO brightness, A density, T density, M density, E density.
Color matching system Not included
UV light source Not included
Work temperature range 0 to 45℃, relative humidity 80% or below( at 35°C ),no condensation
Battery capacity Rechargeable Lithium battery, 20000 continuous measurement tests, 7.4V/600 mAh
Interface USB
Data storage 20000 samples
Display True color TFT touch screen
Light source longevity 10 years, 3 million test
Dimension 181 × 73 × 112 mm
Weight 800 g (without battery)
  • 2.8 inch TFT touch screen
  • High capacity rechargeable lithium-ion battery
  • LED light source for measurement accuracy
  • Pre-locating panel design for instrument calibration
  • SCS system for measurement repeatability
  • Simultaneous measurement of SCI & SCE
  • USB & Bluetooth data transmission
  • Large storage capacity
  • Connection to mini printer for printing

Used in textile, plastic, food, paint, printing, automobile industries, laboratories & on-site applications for quality control purpose.

Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/>
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum:0.04
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum:0.03
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Optical Geometry D/8 (diffused illumination,8° viewing), SCI (Specular Component Included), SCE (Specular Component Excluded)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Optical Geometry D/8 (diffused illumination,8° viewing), Specular Component Included (SCI)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.04
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Range 360 nm to 780 nm
Wavelength Pitch 10 nm
Sensor Silicon Photodiode Array
Grating Method Concave Grating
Wavelength Range 400 nm to 700 nm
Wavelength Interval 10 nm
Sensor High sensitivity silicon photodiode
Light Source LED
Illumination system d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination light source CLED
Sensor Dual light path sensor array
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Excitation Source 150 W Xenon Lamp
Excitation Wavelength 200 nm to 900 nm
Excitation Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Emission Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Wavelength Range 900 nm to 2500 nm
Wavelength Accuracy ≤ 0.2
Wavelength Reproducibility ≤ 0.05
Bandwidth 8 nm

Atomic Absorption Spectrophotometer

Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.

Working spectral range 190 to 900 nm
Spectral Bandwith 0.1, 0.2, 0.4, 1.0 and 2.0 nm
Wavelength accuracy ± 0.15 nm
Wavelength repeatability ≤ 0.04 nm
Wavelength range 190 - 900 nm
Spectral Bandwidth 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm
Wavelength accuracy ≤ ± 0.5 nm
Wavelength repeatability ≤ 0.3 nm(single direction)
Wavelength range 180 - 900 nm
Spectral Bandwidth 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting)
Wavelength accuracy ≤ 0.15 nm
Wavelength repeatability ± 0.1 nm