| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Bandwidth | 8 nm |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05 |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |