Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
Excitation Source | 150 W Xenon Lamp |
Excitation Wavelength | 200 nm to 900 nm |
Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
Wavelength Range | 400 nm to 700 nm |
Wavelength Interval | 10 nm |
Sensor | High sensitivity silicon photodiode |
Light Source | LED |
Wavelength Range | 360 nm to 780 nm |
Wavelength Pitch | 10 nm |
Sensor | Silicon Photodiode Array |
Grating Method | Concave Grating |
Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Sensor | Dual light path sensor array |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
Wavelength range | 200 - 850 nm |
Path length | 1 mm, 2 mm, 5 mm, 10 mm |
Wavelength accuracy | ± 1 nm |
Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
Wavelength range | 200 - 800 nm |
Path length | 0.2 mm (For high concentration measurement); 1.0 mm (For ordinary) |
Wavelength accuracy | ± 1 nm |
Wavelength Resolution | ≤ 3 nm (FWHM at Hg 546 nm) |
Wavelength range | 230 nm, 260 nm, 280 nm |
Path length | 1.0 mm, 0.2 mm |
Minimum Sample size | 0.3 - 2.0 µl |
Absorbance range | 0.2 - 75A (10 mm equivalent absorbance) |
Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Repeatability | Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05 |
Sensor | Blue light enhanced sensor array |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
Sensor | High sensitivity silicon photodiode |
Test angle | - |
Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
Sensor | High sensitivity silicon photodiode |
Test angle | 60° |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |
Wavelength range | 190 to 1100 nm |
Spectral bandwidth | 0.5/1/2/4/5 nm |
Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
Wavelength Repeatability | ≤ 0.1 nm |