Visible spectrophotometer LVS-B10 comes with large memory space which can store multiple sets of data. It comes with monolithic, microprocessor controlled LCD display of 128 × 64 bit. In this vis-spectrophotometer standard curve for quantitative measurement can be established in simple method. Quantitative measurement of standard curve is established through direct input of K & B factor. It is useful in scientific research and industries for detection of impurities and other elements.
| Wavelength Range | 325 ~ 1000 nm |
|---|---|
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 1.0 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Photometric Range | (-0.3) ~ 3 A |
| Photometric Mode | |
| Photometric Accuracy | ± 0.3 % T |
| Photometric Repeatability | 0.15 % τ |
| Transmittance accuracy | |
| Transmittance repeatability | |
| Detector | Import Silicon Photodiode Detector |
| Light Source | Import Tungsten Lamp |
| Stray Light | ≤ 0.05 % τ |
| Stability | 0.001 A / h at 500 nm |
| Data Output Port | |
| Power Requirement | AC 220 V / 50 Hz, 110 V / 60 Hz. |
| Dimensions | 460 × 330 × 210 mm |
| Noise | |
| Weight | 11 kg |
| Gross Weight | |
| Net Weight | |
| Power | 120 W |
| Display LCD | |
| Optical System | |
| Baseline Linearity | |
| Baseline Drift | |
| Baseline Flatness | |
| Printer Port | |
| Packing Size | |
| Software | |
| Packing Weight |
It is useful in scientific research and industries for quantitative and qualitative analysis, detection of impurities and functional groups determination.
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
| Spectral bandwidth | 2 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Spectral bandwidth | 5 nm |
| Wavelength Range | 335 ~ 1000 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | 1 nm |
| Wavelength Range | 320 ~ 1100 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Wavelength Range | 330 to 1000 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | ≤ 1.0 nm |
| Wavelength Range | 320 ~ 1000 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Wavelength Repeatability | ≤ 0.3 nm |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Bandwidth | 8 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |