Visible spectrophotometer LVS-A11 with single beam has 1200 lines/mm grating optical system. It uses silicon photo diode detector and tungsten lamp as light source which provides the best wavelength coverage across the working range of the spectrophotometer. It incorporates the latest technology having high accuracy with digital wavelength display and automatic calibration facility. This highly accurate spectrophotometer is designed for industries and laboratories.
| Wavelength Range | 335 ~ 1000 nm |
|---|---|
| Setting Wavelength | |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | 1 nm |
| Photometric Range | T: 0 ~ 199.9 % , A: (-0.3) ~ 2.5A bs, F: 0 ~ 9999, C: 0 ~ 9999 |
| Photometric Mode | |
| Photometric Accuracy | ± 0.5 % T |
| Photometric Repeatability | 0.2 % T |
| Transmittance accuracy | |
| Transmittance repeatability | |
| Detector | Silicon photo diode |
| Light Source | Tungsten lamp (Socket Type, 20W / 12V, 2000h) |
| Stray Light | ≤ 0.5 % T (360 nm) |
| Stability | ≤ 0.5 % T / 5min |
| Data Output Port | |
| Power Requirement | 220 V / 50 Hz |
| Dimensions | 385 × 330 × 185 mm |
| Noise | |
| Weight | 10 kg |
| Gross Weight | |
| Net Weight | |
| Power | |
| Display LCD | |
| Optical System | 1200 lines / mm grating |
| Baseline Linearity | |
| Baseline Drift | |
| Baseline Flatness | |
| Printer Port | |
| Packing Size | |
| Software | |
| Packing Weight |
Visible spectrophotometer is used for quantitative and qualitative analysis, detection of Impurities and functional groups determination. DNA/Protein analysis.
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength Range | 320 ~ 1000 nm |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Accuracy | ± 1.0 nm |
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Wavelength Repeatability | ≤ 0.3 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
| Spectral bandwidth | 2 nm |
| Wavelength Range | 330 to 1000 nm |
| Spectral Bandwidth | 5 nm |
| Wavelength Accuracy | ± 2 nm |
| Wavelength Repeatability | ≤ 1.0 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Spectral bandwidth | 5 nm |
| Wavelength Range | 320 ~ 1100 nm |
| Spectral Bandwidth | 4 nm |
| Wavelength Accuracy | ± 0.5 nm |
| Wavelength Repeatability | ≤ 0.2 nm |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Bandwidth | 8 nm |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |