Portable spectrophotometer LSP-A20

Portable spectrophotometer LSP-A20 is adopted with every test calibration ETC technology, where the standard white boards included in the optical system for reliable, accuracy of every measurement. The pulse xenon lamp is used for measurement of UV samples with wide wavelength range. Its Built-in camera helps to view measured area precisely. The automatic gloss compensation technology helps in measurement data for the surface of different gloss.

Illumination Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/>
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum:0.04
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination light source Pulse Xenon Lamp
Light source A, C, D50, D65, D75, F1, F2, F3, F4, F5, F6, F7, F8, F9, F10, F11, F12, DLF, TL183, TL184, NBF, U30, U35, CWF
Wavelength range 360-740 nm
Wavelength interval 10 nm
Half spectral width 5 nm
Reflectivity range & resolution 0 to 200%, 0.01%
Observation angle 2°/10°
Measurement time interval 2 seconds
Measurement time 2 seconds
Measuring aperture 8 mm
Color space CIE-L*a*b, L*C*h, L*u*v, XYZ, Yxy, Reflectance, hunterlab, munsell Mi, CMYK, RGB, HSB
Color difference formula ΔE*ab,ΔE*CH,ΔE*uv,ΔE*cmc(2:1),ΔE*cmc(1:1), ΔE*94,ΔE*00,ΔEab(Hunter),555 , color classification
Other colorimetric indices WI (whiteness) (ASTM E313-10,ASTM E313-73,CIE/ISO, AATCC, Hunter, Taube Berger, Ganz, Stensby)<br/> YI (yellowness) (ASTM D1925,ASTM E313-00,ASTM E313-73), Tint(ASTM E313,CIE,Ganz)<br/> Metamerism index Milm, adhesive, Staining fastness, color fastness, ISO b/changing Color fastness, ISO brightness, 8 glossiness, A , T, M, E density
Color matching system Matches
UV light source Included
Work temperature range 0 to 45℃, relative humidity 80% or below( at 35°C ),no condensation
Storage temperature range 25℃ to 55℃ relative humidity 80% or below(at 35°C ),no condensation
Battery capacity
Data being displayed Reflective graph/value,samples color values,color difference values/graph,pass/fail results,color error tendency,color simulation display measurement area,history data color simulation,manual input standard sample generate measurement report
Interface USB, Bluetooth
Data storage 100 test samples , 200 measurement records for each sample
Display True color TFT touch screen
Light source longevity 10 years, 3 million tests
Dimension (L*W*H) 181 × 73 × 112 mm
Weight 550 g
  • 2.8 inch TFT touch screen
  • Built-in camera to view measured area
  • High capacity rechargeable lithium-ion battery
  • CLED light source for measurement accuracy
  • SCS system for measurement repeatability
  • Simultaneous measurement of SCI & SCE
  • Equipped with gloss compensation technology
  • USB & Bluetooth data transmission
  • Customized for PANTONE color matching technology
  • Large storage capacity
  • Connection to mini printer for printing

Portable spectrophotometer has applications in textile, plastic, food, paint, printing, automobile industries, laboratories & on-site applications for quality control purpose.

Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum:0.03
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.04
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Optical Geometry D/8 (diffused illumination,8° viewing), SCI (Specular Component Included), SCE (Specular Component Excluded)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Optical Geometry D/8 (diffused illumination,8° viewing), Specular Component Included (SCI)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Wavelength Range 360 nm to 780 nm
Wavelength Pitch 10 nm
Sensor Silicon Photodiode Array
Grating Method Concave Grating
Illumination system d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination light source CLED
Sensor Dual light path sensor array
Wavelength Range 400 nm to 700 nm
Wavelength Interval 10 nm
Sensor High sensitivity silicon photodiode
Light Source LED
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Excitation Source 150 W Xenon Lamp
Excitation Wavelength 200 nm to 900 nm
Excitation Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Emission Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm

Double Beam UV/Vis Spectrophotometer

Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.

Wavelength range 190 to 1100 nm
Spectral bandwidth 0.5/1/2/4/5 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 2 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 1 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm

Single Beam UV/Visible Spectrophotometer

We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations

Wavelength range 190 to 1100 nm
Spectral bandwidth 1 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 2 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 0.5/1/2/4/5 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm