Portable Spectrophotometer LSP-A41

Portable Spectrophotometer LSP-A41 is powerful performance configuration device which makes color measurement more professional. Offers integrated camera to see the measurement area for accurate test. It features full spectrum LED with high life as the light source, and excellent inter-instrument agreement ensures consistency of the measurement data of multiple device. UV Included/ UV Excluded to measure color and color difference for samples with fluorescence. It Supports 26 kinds of color indexes and 26 kinds of illuminants. Designed with wireless connection with Android or IOS devices via Bluetooth. It greatly expands the application boundary of color spectrophotometer, automatic calibration, magnetic seat charging. It offers the condition of d/8 diffused illumination, 8° viewing, Specular Component Included (SCI) and (SCE) Specular Component Excluded fluorescent samples. It has stable performance, accurate color measurement and powerful function.

Optical Geometry D/8 (diffused illumination,8° viewing), SCI (Specular Component Included), SCE (Specular Component Excluded)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Sensor 256 pixel CMOS sensor
Wavelength Range 400 to 700 nm
Wavelength Interval 10 nm
Semi band Width 10 nm
Calibration Auto
Observer Angles 2°,10°
Measured Reflectance Range 0 to 200%
Reflectance Resolution 0.0001
Measuring Aperture MAV: Φ8 mm / Φ11 mm MAV: Φ4 mm / Φ6 mm MINI: 1×3 mm
Inter-instrument agreement ΔE × ab<0.2 (BCRA Series Ⅱ, average measurement of 12 tiles, MAV/SCI)
Repeatability Chromaticity value: Max.: dE × ab< 0.04 Average: dE × ab< 0.03 Standard deviation within ΔE × ab 0.02 (when a white tile is measured 30 times at 5-seconds interval) Reflectance: Standard deviation < 0.1%
Illuminant A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84
Measuring Time 2° / 10°
Storage About 1 s
Displayed Data APP mass storage
Data Port IPS Full Color Screen, 2.4 inches
Camera USB, Bluetooth
Data Storage With
Language 10 years, 1 million tests
Pass Metrology English
Software Yes, metrology level I
Dimension Android, IOS, Windows
Battery 77.8 × 53.2 × 185.7 mm
Weight Rechargeable, 8000 times continuous tests, 3.7V/3000 mAh
  • Designed with combined LED light source with high life
  • Inter-instrument agreement <0.2 which ensures test results consistency of multiple devices
  • Durable and stable aperture size to measure samples with different sizes
  • UV Included/ UV Excluded to measure color and color difference for samples with fluorescence
  • Integrated camera to see the measurement area for accurate test
  • Offers revolutionary auto calibration technology allows the instrument to achieve automatic calibration
  • Supports 26 kind of illuminants such as D65/D50, etc
  • Supports 20 kinds of color indexes such as CIE-Lab, CIE-LCh, whiteness, yellowness, opacity, etc
  • Designed with 256 pixel CMOS sensor
  • Accurate spectrum and lab data, used for color matching and accurate color transmission
  • Auto calibration technology, improves user-experience
  • Multi-function calibration base protest the white tile, combines calibration and charging functions in one
  • USB / Bluetooth dual communication mode, wider adaptability
  • Connection mobile device application to find the similar color from different color swatches
  • PC software has powerful function expansion

Portable Spectrophotometer is used in plastic electronics, paint and coating, textile printing and dyeing, printing paper, automobile, medical treatment, cosmetics and food industries, as well as scientific research institutions and laboratories etc.

Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum:0.03
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.04
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Optical Geometry D/8 (diffused illumination,8° viewing), Specular Component Included (SCI)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/>
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum:0.04
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Wavelength Range 360 nm to 780 nm
Wavelength Pitch 10 nm
Sensor Silicon Photodiode Array
Grating Method Concave Grating
Wavelength Range 400 nm to 700 nm
Wavelength Interval 10 nm
Sensor High sensitivity silicon photodiode
Light Source LED
Illumination system d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination light source CLED
Sensor Dual light path sensor array

Single Beam UV/Visible Spectrophotometer

We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations

Wavelength range 190 to 1100 nm
Spectral bandwidth 0.5/1/2/4/5 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 1 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 2 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Excitation Source 150 W Xenon Lamp
Excitation Wavelength 200 nm to 900 nm
Excitation Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Emission Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm

Visible Spectrophotometer

Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.

Wavelength Range 330 to 1000 nm
Spectral Bandwidth 5 nm
Wavelength Accuracy ± 2 nm
Wavelength Repeatability ≤ 1.0 nm
Wavelength Range 325 ~ 1000 nm
Setting Wavelength Automatic
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 1.0 nm
Wavelength Range 335 ~ 1000 nm
Spectral Bandwidth 4 nm
Wavelength Accuracy ± 2 nm
Wavelength Repeatability 1 nm