Portable Spectrophotometer LSP-C11

Portable Spectrophotometer LSP-C11 adopts 1000 line precision blazed grating as the spectroscopic element, the silicon photocell array with large photosensitive area as the detector. The full spectrum LED with high life as the light source, and the optical resolution is less than 10 nm in the visible light range. Under the condition of d/8 geometric optical illumination recommended by CIE, spectrophotometer can accurately measure the SCI and SCE reflectance data of samples / fluorescent samples. It has stable performance, accurate color measurement and powerful function.

Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Light Source Combined full spectrum LED light source, UV light source
Spectrophotometric Mode Flat Grating
Sensor Silicon photodiode array (double row 40 groups)
Wavelength Range 400 to 700 nm
Wavelength Interval 10 nm
Semi band Width 10 nm
Measured Reflectance Range 0 to 200%
Measuring Aperture MAV Φ8 mm / Φ10 mm SAV Φ4 mm / Φ5 mm
Specular Component SCI & SCE
Color Space CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, βxy,DIN, Munsell (C/2)
Color Difference Formula ΔE×ab, ΔE×uv, ΔE×94, ΔE×cmc(2:1), ΔE×cmc(1:1), ΔE×00
Other Colorimetric Index WI (ASTM E313,CIE/ISO, AATCC, Hunter), YI(ASTM D1925, ASTM 313), Metamerism Index MI, Staining Fastness, Color Fastness, Color Strength, Opacity, 8° Glossiness, 555 tone classification
Illuminant D65, A , C, D50, F2(CWF), F7(DLF), F10(TPL5), F11(TL84), F12(TL83/U30)
Observer Angle 2° / 10°
Measuring Time About 1.5 s (Measure SCI & SCE about 3.2 s)
Repeatability Spectral reflectance: MAV/SCI, Standard deviation within 0.1% (400 nm to 700 nm: within 0.2%) Chromaticity value: MAV/SCI, within ΔE × ab 0.04 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration)
Inter-instrument Error MAV/SCI, Within ΔE×ab0.2 (Average for 12 BCRA Series II color tiles)
Measurement Mode Single Measurement, Average Measurement(2 to 99 times)
Locating Method Camera Locating, stabilizer cross position
Displayed Data 3.5 inch TFT color LCD, Capacitive Touch Screen
Data Port USB
Data Storage Standard 1000 Pcs, Sample 20000 Pcs
Language English
Operating temperature 0 to 40ºC
Operating humidity 0 to 85 % RH
Dimension 129 × 76 × 217 mm
Battery Li-ion battery, 6000 measurements within 8 hours
Weight Approx. 600 g
  • Designed with combined LED light source with high life and low power consumption, including UV / excluding UV
  • Dual optical path system, the optical resolution in the visible range is less than 10 nm
  • It measures the SCI and SCE spectrum of the sample at the same time
  • Accurate spectrum and lab data, used for color matching and accurate color transmission
  • USB / Bluetooth dual communication mode, wider adaptability
  • Large capacity storage space, which can store more than 30000 pieces of test data
  • Camera locating position and Stabilizer cross measurement position
  • PC software has powerful function expansion

Portable Spectrophotometer is used in plastic electronics, paint and coating, textile printing and dyeing, printing paper, automobile, medical treatment, cosmetics and food industries, as well as scientific research institutions and laboratories etc.

Optical Geometry D/8 (diffused illumination,8° viewing), Specular Component Included (SCI)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.04
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/>
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum:0.04
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Optical Geometry D/8 (diffused illumination,8° viewing), SCI (Specular Component Included), SCE (Specular Component Excluded)
Integrating Sphere Size Φ 40 mm
Light Source LED (Full band balanced LED)
Color Spaces and Indices Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM),Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Photoelectric diode sensor
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Reflect 8º(diffused illumination, 8 degree viewing angle)
Optical Geometry SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source
Standards ISO7724-1, ASTM E1164, DIN5033 Teil7
Integrating Sphere Size Φ 40 mm
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum:0.03
Sensor Dual light path sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating

Visible Spectrophotometer

Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.

Wavelength Range 330 to 1000 nm
Spectral Bandwidth 5 nm
Wavelength Accuracy ± 2 nm
Wavelength Repeatability ≤ 1.0 nm
Wavelength Range 325 ~ 1000 nm
Setting Wavelength Automatic
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 1.0 nm
Wavelength Range 335 ~ 1000 nm
Spectral Bandwidth 4 nm
Wavelength Accuracy ± 2 nm
Wavelength Repeatability 1 nm

Double Beam UV/Vis Spectrophotometer

Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.

Wavelength range 190 to 1100 nm
Spectral bandwidth 1 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 2 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Wavelength range 190 to 1100 nm
Spectral bandwidth 0.5/1/2/4/5 nm
Wavelength Accuracy ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all
Wavelength Repeatability ≤ 0.1 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Light source 150 W Xenon lamp
Excitation wavelength 200 nm to 900 nm
Emission wavelength 200 nm to 900 nm
Excitation slit 2 nm, 5 nm, 10 nm, 20 nm
Excitation Source 150 W Xenon Lamp
Excitation Wavelength 200 nm to 900 nm
Excitation Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Emission Slit 1 nm, 2 nm, 5 nm, 10 nm, 20 nm
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle 60°
Illumination d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement
Repeatability Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05
Sensor Blue light enhanced sensor array
Size of integrated sphere 40 mm, alvan diffused reflection surface coating
Illumination 45/0 (45 ring shaped illumination,0° observation angle)
Repeatability Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05
Sensor High sensitivity silicon photodiode
Test angle -
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 1 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all
Optical system Double Beam, Grating 1200 lines/mm
Wavelength Range 190 nm to 1100 nm
Spectral Bandwidth 2 nm
Wavelength Accuracy ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all