Portable Spectrophotometer LSP-A40 is powerful performance configuration device which makes color measurement more professional. It features full spectrum LED with high life as the light source, and excellent inter-instrument agreement ensures consistency of the measurement data of multiple device. It Supports 26 kinds of color indexes and 26 kinds of illuminants. Designed with wireless connection with Android or IOS devices via Bluetooth. It greatly expands the application boundary of color spectrophotometer, automatic calibration, magnetic seat charging. It offers the condition of d/8 diffused illumination, 8° viewing and Specular Component Included (SCI) fluorescent samples. It has stable performance, accurate color measurement and powerful function.
| Optical Geometry | D/8 (diffused illumination,8° viewing), Specular Component Included (SCI） |
|---|---|
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Color Spaces and Indices | Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM）,Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength |
| Sensor | 256 pixel CMOS sensor |
| Wavelength Range | 400 to 700 nm |
| Wavelength Interval | 10 nm |
| Semi band Width | 10 nm |
| Calibration | Auto |
| Observer Angles | 2°,10° |
| Measured Reflectance Range | 0 to 200% |
| Reflectance Resolution | 0.0001 |
| Measuring Aperture | MAV: Φ8 mm / Φ10 mm |
| Inter-instrument agreement | ΔE × ab＜0.3 (BCRA Series Ⅱ, average measurement of 12 tiles, MAV/SCI） |
| Repeatability | Chromaticity value: Max.: dE × ab< 0.1 Average: dE × ab< 0.05 Standard deviation within ΔE × ab 0.03 (when a white tile is measured 30 times at 5-seconds interval) Reflectance: Standard deviation < 0.1% |
| Illuminant | A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84 |
| Measuring Time | 2° / 10° |
| Storage | About 2 s |
| Displayed Data | APP mass storage |
| Data Port | IPS Full Color Screen, 2.4 inches |
| Camera | USB, Bluetooth |
| Data Storage | Without |
| Language | 10 years, 1 million tests |
| Pass Metrology | English |
| Software | Yes, metrology level I |
| Dimension | Android, IOS, Windows |
| Battery | 77.8 × 53.2 × 185.7 mm |
| Weight | Rechargeable, 8000 times continuous tests, 3.7V/3000 mAh |
Portable Spectrophotometer is used in plastic electronics, paint and coating, textile printing and dyeing, printing paper, automobile, medical treatment, cosmetics and food industries, as well as scientific research institutions and laboratories etc.
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.04 |
| Sensor | Photoelectric diode sensor |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Photoelectric diode sensor |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 40 mm |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Optical Geometry | D/8 (diffused illumination,8° viewing), SCI （Specular Component Included), SCE （Specular Component Excluded） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Color Spaces and Indices | Reflectance, CIE-Lab, CIE-LCh, Hunter Lab, CIE Luv, XYZ, Yxy, RGB, Colour difference (ΔE × ab, ΔE × cmc, ΔE × 94, ΔE × 00), WI (ASTM E313-00, ASTM E313- 73, CIE/ISO, AATCC, Hunter, Taube Berger Stensby), YI (ASTM D1925, ASTM E313-00, ASTM E313-73), Blackness (My,dM）,Colour Fastness, Tint,(ASTM E313-00),Colour Density CMYK(A,T,E,M), Milm, Munsell, Opacity, Colour strength |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum：0.03 |
| Sensor | Dual light path sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/> |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum：0.04 |
| Sensor | Dual light path sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 40 mm |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Repeatability | ≤ 0.1 nm |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | 60° |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Test angle | - |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength range | 200 - 850 nm |
| Path length | 1 mm, 2 mm, 5 mm, 10 mm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
| Wavelength range | 230 nm, 260 nm, 280 nm |
| Path length | 1.0 mm, 0.2 mm |
| Minimum Sample size | 0.3 - 2.0 µl |
| Absorbance range | 0.2 - 75A (10 mm equivalent absorbance) |
| Wavelength range | 200 - 800 nm |
| Path length | 0.2 mm (For high concentration measurement); 1.0 mm (For ordinary) |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | ≤ 3 nm (FWHM at Hg 546 nm) |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Grating Method | Concave Grating |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Sensor | Dual light path sensor array |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Light Source | LED |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |