Portable Spectrophotometer LSP-C10 adopts 1000 line precision blazed grating as the spectroscopic element, the silicon photocell array with large photosensitive area as the detector. The full spectrum led with high life as the light source, and the optical resolution is less than 10 nm in the visible light range. Under the condition of d/8 geometric optical illumination recommended by CIE, spectrophotometer can accurately measure the SCI and SCE reflectance data of samples / fluorescent samples. It has stable performance, accurate color measurement and powerful function.
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | Combined full spectrum LED light source, UV light source |
| Spectrophotometric Mode | Flat Grating |
| Sensor | Silicon photodiode array (double row 40 groups) |
| Wavelength Range | 400 to 700 nm |
| Wavelength Interval | 10 nm |
| Semi band Width | 10 nm |
| Measured Reflectance Range | 0 to 200% |
| Measuring Aperture | MAV Φ8 mm / Φ10 mm SAV Φ4 mm / Φ5 mm |
| Specular Component | SCI & SCE |
| Color Space | CIE LAB, XYZ, Yxy, LCh, CIE LUV, s-RGB, HunterLab, βxy,DIN Lab99 Munsell (C/2) |
| Color Difference Formula | ΔE×ab, ΔE×uv, ΔE×94, ΔE×cmc(2:1), ΔE×cmc(1:1), ΔE×00, DINΔE99, ΔE (Hunter) |
| Other Colorimetric Index | WI (ASTM E313，CIE/ISO, AATCC, Hunter), YI(ASTM D1925， ASTM 313), Metamerism Index MI, Staining Fastness, Color Fastness, Color Strength, Opacity, 8° Glossiness, 555 tone classification |
| Illuminant | D65, A , C, D50, D55, D75, F1, F2(CWF), F3, F4, F5, F6, F7(DLF), F8, F9, F10(TPL5), F11(TL84), F12(TL83/U30) |
| Observer Angle | 2° / 10° |
| Measuring Time | About 1.5 s (Measure SCI & SCE about 3.2 s) |
| Repeatability | Spectral reflectance: MAV/SCI, Standard deviation within 0.08% (400 nm to 700 nm: within 0.18%) Chromaticity value: MAV/SCI, within ΔE × ab 0.02 ( When a white calibration plate is measured 30 times at 5 second intervals after white calibration) |
| Inter-instrument Error | MAV/SCI, Within ΔE×ab0.15 (Average for 12 BCRA Series II color tiles) |
| Measurement Mode | Single Measurement, Average Measurement(2 to 99 times) |
| Locating Method | Camera Locating, stabilizer cross position |
| Displayed Data | 3.5 inch TFT color LCD, Capacitive Touch Screen |
| Data Port | USB, Bluetooth 4.2 |
| Data Storage | Standard 1000 Pcs, Sample 30000 Pcs |
| Language | English |
| Operating temperature | 0 to 40ºC |
| Operating humidity | 0 to 85 %RH |
| Dimension | 129 × 76 × 217 mm |
| Battery | Li-ion battery, 6000 measurements within 8 hours |
| Weight | Approx. 600 g |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Photoelectric diode sensor |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum：0.03 |
| Sensor | Dual light path sensor array |
| Optical Geometry | D/8 (diffused illumination,8° viewing), SCI （Specular Component Included), SCE （Specular Component Excluded） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.04 |
| Sensor | Photoelectric diode sensor |
| Illumination | Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/> |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum：0.04 |
| Sensor | Dual light path sensor array |
| Optical Geometry | D/8 (diffused illumination,8° viewing), Specular Component Included (SCI） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.0 nm |
| Optical System | Double beam |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam |
| Wavelength range | 190 ~ 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength accuracy | 0.5 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.8 nm |
| Optical system | Double beam; 1200 lines/mm grating |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.0 to 5.0 nm (adjustable) |
| Optical system | Double beam, C-T monochromator, 1600 L/mm holographic grating |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4 nm |
| Wavelength Accuracy | ± 0.1nm (D2, 656.1 nm), ± 0.3 nm full range |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam, C-T monochromator，1200 L/mm holographic grating |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength | 260 nm and 280 nm; Fixed |
| Spectral resolution | ≤ 8 nm |
| Path length | 0.5 mm |
| Wavelength range | 190 to 850 nm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength Range | 200 to 1000 nm |
| Spectral Bandwidth | 4.0 nm |
| Optical System | Single beam |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 4 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 1.8 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 nm, 1 nm, 2 nm, 4 nm adjustable |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Wavelength range | 190 nm ~ 900 nm |
| Spectral bandwidth | 0.1 nm, 0.2 nm, 1.0 nm, 2.0 nm |
| Wavelength accuracy | ± 0.25 nm |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0.1 nm,0.2 nm,0.4 nm, 1.0 nm, 2.0 nm automatic setting |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Illumination system | d/0 (Diffused lighting, 0° observation viewing), SCS optical engine (light splitting and integration system), ETC (every time calibration technology), SCI (specular reflection included)/ SCE (specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 15.2 cm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
