Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
Sensor | High sensitivity silicon photodiode |
Test angle | 60° |
Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
Repeatability | Light splitting reflectivity:standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum:0.05 |
Sensor | High sensitivity silicon photodiode |
Test angle | - |
Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Repeatability | Light splitting reflectivity:standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum:0.05 |
Sensor | Blue light enhanced sensor array |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Wavelength Range | 360 nm to 780 nm |
Wavelength Pitch | 10 nm |
Sensor | Silicon Photodiode Array |
Grating Method | Concave Grating |
Wavelength Range | 400 nm to 700 nm |
Wavelength Interval | 10 nm |
Sensor | High sensitivity silicon photodiode |
Light Source | LED |
Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
Illumination light source | CLED |
Sensor | Dual light path sensor array |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
Wavelength Range | 335 ~ 1000 nm |
Spectral Bandwidth | 4 nm |
Wavelength Accuracy | ± 2 nm |
Wavelength Repeatability | 1 nm |
Wavelength Range | 330 to 1000 nm |
Spectral Bandwidth | 5 nm |
Wavelength Accuracy | ± 2 nm |
Wavelength Repeatability | ≤ 1.0 nm |
Wavelength Range | 325 ~ 1000 nm |
Setting Wavelength | Automatic |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 1.0 nm |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 2 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Optical system | Double Beam, Grating 1200 lines/mm |
Wavelength Range | 190 nm to 1100 nm |
Spectral Bandwidth | 1 nm |
Wavelength Accuracy | ± 0.1 nm @ 656.1 nm, ± 0.3 nm @ all |
Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |
Excitation Source | 150 W Xenon Lamp |
Excitation Wavelength | 200 nm to 900 nm |
Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Emission Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
Light source | 150 W Xenon lamp |
Excitation wavelength | 200 nm to 900 nm |
Emission wavelength | 200 nm to 900 nm |
Excitation slit | 2 nm, 5 nm, 10 nm, 20 nm |