Double Beam UV-Vis Spectrophotometer LUS-B20 is a double beam designed UV-Vis spectrophotometer, offers 190 to 1100 nm of wavelength range with C-T monochromator and 1600 L/mm holographic grating. Features 3D spectrogram measurement for sample with dynamic change, this spectrophotometer has adjustable spectral bandwidth of 1.0 nm to 5.0 nm. Designed compactly with fixed 2 trench sample holder, deuterium and tungsten lamp as light source, it has automatic calibration. Equipped with photomultiplier sensor, digital signal and USB interface, 4 quartz cuvette, this spectrophotometer provides high resolution, low stray light, lasting stability, and powerful software function.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.0 to 5.0 nm (adjustable) |
| Optical system | Double beam, C-T monochromator, 1600 L/mm holographic grating |
| Wavelength accuracy | ±0.3 nm |
| Wavelength repeatability | 0.1 nm |
| Wavelength resolution | 0.05 nm |
| Wavelength edge noise | 100%T line ≤0.1%T；0%T line ≤0.05%T |
| Stray light | 0.015 %T (at 220nm and 360 nm) |
| Baseline flatness | ≤±0.001 Abs |
| Baseline noise | ±0.1 %T |
| Baseline drift | ≤0.0004 Abs / h (after warm-up at 500 nm) |
| Standard sample holder | Fixed 2 trench sample holder |
| Measuring length | 0 to 200% T, -4.000 to 4.000 Abs, -9999 to 9999C, -9999 to 9999F |
| Transmittance accuracy | ±0.3 %T |
| Transmittance repeatability | 0.1 % T |
| Light switching point | Adjustable; 294 nm to 365 nm |
| Light Source | Deuterium lamp, Tungsten lamp (20 W/12 V) |
| Detector | Silicon photodiode detector |
| Interface | Digital signal; USB |
| Cuvette | 4 quartz cuvette; 10 mm optical path |
| Power supply | 220 V ± 10%, 50Hz |
| Power | 200 W |
| Dimension (L×W×H) | 620×510×245 mm |
| Package dimension (L×W×H) | 745×635×400 mm |
| Net weight | 30 kg |
| Gross weight | 39 kg |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.8 nm |
| Optical system | Double beam; 1200 lines/mm grating |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4 nm |
| Wavelength Accuracy | ± 0.1nm (D2, 656.1 nm), ± 0.3 nm full range |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam, C-T monochromator，1200 L/mm holographic grating |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.0 nm |
| Optical System | Double beam |
| Wavelength range | 190 ~ 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength accuracy | 0.5 nm |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength | 260 nm and 280 nm; Fixed |
| Spectral resolution | ≤ 8 nm |
| Path length | 0.5 mm |
| Wavelength range | 190 to 850 nm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 4 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Range | 200 to 1000 nm |
| Spectral Bandwidth | 4.0 nm |
| Optical System | Single beam |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 nm, 1 nm, 2 nm, 4 nm adjustable |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1.8 nm |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Wavelength range | 190 nm ~ 900 nm |
| Spectral bandwidth | 0.1 nm, 0.2 nm, 1.0 nm, 2.0 nm |
| Wavelength accuracy | ± 0.25 nm |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0.1 nm,0.2 nm,0.4 nm, 1.0 nm, 2.0 nm automatic setting |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/0 (Diffused lighting, 0° observation viewing), SCS optical engine (light splitting and integration system), ETC (every time calibration technology), SCI (specular reflection included)/ SCE (specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 15.2 cm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Optical Geometry | D/8 (diffused illumination,8° viewing), SCI （Specular Component Included), SCE （Specular Component Excluded） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Optical Geometry | D/8 (diffused illumination,8° viewing), Specular Component Included (SCI） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.04 |
| Sensor | Photoelectric diode sensor |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Illumination | Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/> |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum：0.04 |
| Sensor | Dual light path sensor array |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum：0.03 |
| Sensor | Dual light path sensor array |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Photoelectric diode sensor |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
