Double Beam UV-Vis Spectrophotometer LUS-B40 a bench top device with 190 nm to 1100 nm wavelength range, and offers spectral bandwidth of 0.5/1/2/4 nm. Equipped with 16 mm thick rigid aluminium board as optical base, which highly ensures stability and reliability. Features dual optical path, dual beam optical system, dual detector, uses high performance imported prism grating, Tungsten Lamp & Deuterium Lamp as light source, and Imported silicon photodiode as detector with stronger stability, reliability, delivers results that are more accurate. Designed with 10 inch TFT Touch colored screen, can work on powerful software as well, and it performs functions like Photometric measurement, Quantitative measurement, Kinetics, Spectrum scan, DNA/Protein test, Multi-wavelength test etc. Three operation modes are available; they are Host, Computer and Mobile phone (App). This advance, high quality spectrophotometer supports USB data transfer and storage system.
| Wavelength range | 190 to 1100 nm | |||
| Spectral bandwidth | 0.5/1/2/4 nm | |||
| Wavelength Accuracy | ± 0.1nm (D2, 656.1 nm), ± 0.3 nm full range | |||
| Wavelength Repeatability | ≤ 0.1 nm | |||
| Optical system | Double beam grating 1200 lines/mm | |||
| Photometric Range | 0 to 200 %T, -0.3 to 3.0 A, 0 to 9999 C (0 to 9999F) | |||
| Photometric Accuracy |
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| Photometric Repeatability |
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| Detector | Imported silicon photodiode | |||
| Light source | Imported Deuterium and Tungsten lamp | |||
| Stray light | ≤ 0.03 % T @ 220 nm, 360 nm | |||
| Stability | ± 0.0004 A/h @ 500 nm | |||
| Data Output Port | USB drive, USB host, RS232 | |||
| Print Port | USB drive, USB host, RS232 | |||
| Power supply | AC 220 V, 50 Hz or 110 V, 60 Hz | |||
| Noise | ± 0.0004 | |||
| Baseline flatness | ± 0.001 A | |||
| Work mode | T, A, C, E | |||
| Scanning speed | Hi, Med, Low (Max. 3000 nm/min) | |||
| Wavelength setting | Auto | |||
| Cuvette holder | 10 mm single hole cell holder | |||
| Display | 10.1 inches TFT colored capacitive touch screen | |||
| Dimension | 630 × 430 × 210 mm | |||
| Gross weight | 28 kg |
Our range of Double Beam UV/VIS spectrophotometers offer long optical path which ensure high accuracy and stability. Its design measures the transmittance of the sample and solvent simultaneously. It is highly precise and performs powerful analysis.
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 nm adjustable |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam |
| Wavelength range | 190 ~ 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength accuracy | 0.5 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.0 to 5.0 nm (adjustable) |
| Optical system | Double beam, C-T monochromator, 1600 L/mm holographic grating |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Optical System | Double beam, C-T monochromator，1200 L/mm holographic grating |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1.8 nm |
| Optical system | Double beam; 1200 lines/mm grating |
| Wavelength Range | 190 to 1100 nm |
| Spectral Bandwidth | 1.0 nm |
| Optical System | Double beam |
We produce a wide range of Nano spectrophotometer for qualitative and quantitative analysis of DNA/RNA in the sample. Our product is highly sensitive and requires only 0.5-2µl of sample for analysis.
| Wavelength | 260 nm and 280 nm; Fixed |
| Spectral resolution | ≤ 8 nm |
| Path length | 0.5 mm |
| Wavelength range | 190 to 850 nm |
| Wavelength accuracy | ± 1 nm |
| Wavelength Resolution | 2 nm (FWHM at Hg 546 nm) |
We manufacture highly precise UV/Vis automatic scanning spectrophotometer with wavelength ranging from 190-1100nm. It can perform quantitative measurement, photometric measurement, spectrum scanning, DNA/Protein analysis. It is in demand for its user-friendly operations
| Wavelength Range | 200 to 1000 nm |
| Spectral Bandwidth | 4.0 nm |
| Optical System | Single beam |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1.8 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 nm, 1 nm, 2 nm, 4 nm adjustable |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 1 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 2 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 1 nm |
| Wavelength range | 190 to 1100 nm |
| Spectral bandwidth | 0.5/1/2/4/5 nm |
| Wavelength Accuracy | ± 0.1nm @ 656.1 nm, ± 0.3 nm @ all |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Spectral Bandwidth | 0.5 / 1.0 / 2.0 / 4.0 / 5.0 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 4 nm |
| Wavelength Range | 190 ~ 1100 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 1.8 nm |
Labtron provides extensive range of visible spectrophotometer LVS series which can operate over a wavelength range of 320-1100nm. It brings unmatched performance with outstanding accuracy and precision.
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 325 to 1000nm |
| Wavelength range | 320 to 1100 nm |
| Spectral bandwidth | 2.0 nm |
| Wavelength Accuracy | ± 0.8 nm |
| Photometry | Single Beam |
| Monochromatic Type | Czerny-Turner |
| Wavelength range | 340 to 1000nm |
| Wavelength Range | 325 ~ 1000 nm |
| Setting Wavelength | Automatic |
| Spectral Bandwidth | 2 nm |
Labtron Atomic Absorption Spectrophotometer makes use of the modern in technology. It is acquired after thorough research into the desires of the diagnostic community. It has all the power, performance and speed necessitated in today’s modern laboratory.
| Wavelength range | 180 - 900 nm |
| Spectral Bandwidth | 0, 0.2, 0.4, 1.0, 2.0nm (Automatic setting) |
| Wavelength range | 190 nm ~ 900 nm |
| Spectral bandwidth | 0.1 nm, 0.2 nm, 1.0 nm, 2.0 nm |
| Wavelength accuracy | ± 0.25 nm |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0.1 nm,0.2 nm,0.4 nm, 1.0 nm, 2.0 nm automatic setting |
| Wavelength range | 180 – 900 nm |
| Spectral Bandwidth | 0 nm, 0.2 nm, 0.4 nm, 1.0 nm, 2.0 nm (5 steps with automatic changeover) |
| Working spectral range | 190 to 900 nm |
| Spectral Bandwith | 0.1, 0.2, 0.4, 1.0 and 2.0 nm |
| Wavelength accuracy | ± 0.15 nm |
| Wavelength range | 190 - 900 nm |
| Spectral Bandwidth | 0.2 nm, 0.4 nm, 0.7 nm, 1.4 nm, 2.4 nm, 5.0 nm |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 15.2 cm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Illumination system | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Wavelength Range | 400 nm to 700 nm |
| Wavelength Interval | 10 nm |
| Sensor | High sensitivity silicon photodiode |
| Wavelength Range | 360 nm to 780 nm |
| Wavelength Pitch | 10 nm |
| Sensor | Silicon Photodiode Array |
| Illumination system | d/0 (Diffused lighting, 0° observation viewing), SCS optical engine (light splitting and integration system), ETC (every time calibration technology), SCI (specular reflection included)/ SCE (specular reflection excluded) simultaneous measurement |
| Size of integrated sphere | 40 mm, alvan diffused reflection surface coating |
| Illumination light source | CLED |
| Optical Geometry | D/8 (diffused illumination,8° viewing), SCI （Specular Component Included), SCE （Specular Component Excluded） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Blue light enhanced sensor array |
| Optical Geometry | D/8 (diffused illumination,8° viewing), Specular Component Included (SCI） |
| Integrating Sphere Size | Φ 40 mm |
| Light Source | LED (Full band balanced LED) |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),br/> Maximum：0.03 |
| Sensor | Dual light path sensor array |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Reflect | 8º(diffused illumination, 8 degree viewing angle) |
| Optical Geometry | SCI (specular component included)/SCE (specular component excluded) Include UV / excluded UV light source |
| Standards | ISO7724-1, ASTM E1164, DIN5033 Teil7 |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.02(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.04 |
| Sensor | Photoelectric diode sensor |
| Illumination | d/8 (Diffused lighting, 8° observation angle)<br/> SCS optical engine (light splitting and integration system)<br/> ETC (real time calibration technology )<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.03(After calibration, standard deviation of 30 measurements on test white board, 5 second intervals)<br/> Maximum：0.05 |
| Sensor | Photoelectric diode sensor |
| Illumination | Observation angles 2°/10°<br/> Illumination: d/8 (Diffused lighting, 8° observation angle)<br/> SCI (specular reflection included) & SCE(specular reflection excluded) simultaneous measurement<br/> |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08%<br/> Color values:ΔE*ab<=0.015 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals),Maximum：0.04 |
| Sensor | Dual light path sensor array |
| Illumination | 45/0 (45 ring shaped illumination,0° observation angle) |
| Repeatability | Light splitting reflectivity：standard deviation within 0.08% Color values: ΔE*ab<=0.03 (After calibration, standard deviation of 30 measurements on test white board, 5 second intervals) Maximum：0.05 |
| Sensor | High sensitivity silicon photodiode |
| Wavelength Range | 900 nm to 2500 nm |
| Wavelength Accuracy | ≤ 0.2 |
| Wavelength Reproducibility | ≤ 0.05 |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Excitation Source | 150 W Xenon Lamp |
| Excitation Wavelength | 200 nm to 900 nm |
| Excitation Slit | 1 nm, 2 nm, 5 nm, 10 nm, 20 nm |
| Light source | 150 W Xenon lamp |
| Excitation wavelength | 200 nm to 900 nm |
| Emission wavelength | 200 nm to 900 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 2 nm |
| Optical system | Double Beam, Grating 1200 lines/mm |
| Wavelength Range | 190 nm to 1100 nm |
| Spectral Bandwidth | 1 nm |
